Study of nanoscale local conductance of Al doped ZnO thin films with varying substrate temperature using Conducting probe atomic force microscopy

Patel, TvaritTvaritPatelSingh, Chetan C.Chetan C.SinghPanda, EmilaEmilaPanda2025-09-042025-09-042014-09-15https://d8.irins.org/handle/IITG2025/31096en-USAtomic Force MicroscopyConducting probeNanoscaleStudy of nanoscale local conductance of Al doped ZnO thin films with varying substrate temperature using Conducting probe atomic force microscopyConference PaperConference Paper123456789/573