Single and double node upset hardened flip flop space applications

Mekie, JoyceeGupta, ShubhanshuShubhanshuGupta2025-09-042025-09-042018-01-01https://d8.irins.org/handle/IITG2025/32150ill.; 29 cm.Space Application16210095Radiation-active EnvironmentsRadiation HardeningUMC 28nm CMOS TechnologyRadiation ImmunityDNU-resilient DesignSingle and double node upset hardened flip flop space applicationsM.Techxi, 90p.M.Tech123456789/500