Role of tip geometry in Conductive Atomic Force Microscopy for investigating nanoscale surface electrical properties of Al-doped ZnO films

Patel, TvaritTvaritPatelPanda, EmilaEmilaPanda2025-09-042025-09-042016-12-12https://d8.irins.org/handle/IITG2025/31108en-USRole of tip geometry in Conductive Atomic Force Microscopy for investigating nanoscale surface electrical properties of Al-doped ZnO filmsConference PaperConference Paper123456789/573