Study of nanoscale local conductance of Al doped ZnO thin films with varying substrate temperature using Conducting probe atomic force microscopy
Source
European Materials Research Society Fall meeting 2014
Date Issued
2014-09-15
Author(s)
Patel, Tvarit
Singh, Chetan C.
Panda, Emila
Subjects
Atomic Force Microscopy
Conducting probe
Nanoscale